Optical sensors,Optical measurement systems, Systems for measuring optical parameters of devices and systems,Measurement and analysis systems for optical parameters,Measurement systems for laser characterization,Holographic systems and components, Laser-aided test and measurement systems

Electrical engineering/Electronics/Semiconductors,Medicine/Biotechnology,3D Printing & Additive Manufacturing,Automotive engineering,Aviation/Aerospace,Optics,Material handling/Processing,Defence industry,Precision mechanics,Sensor technology,Colleagues/Universities/Research institutes

美国Lumetircs研发的非接触式测厚仪，采用白光干涉原理，可快速测量12μm-80mm透光材料的厚度，精度为0.1μm，测单层和多层厚度（20层）可选多探头配置，内部自校准，NIST追溯。